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Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/In(x)Ga(1-x)N structures using optical conductivity enhancement. (2010)

First Author: Morris RJ

Attributed to: Structural and electronic properties of InN surfaces and interfaces funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/rcm.4623

PubMed Identifier: 20552690

Publication URI: http://europepmc.org/abstract/MED/20552690

Type: Journal Article/Review

Volume: 24

Parent Publication: Rapid communications in mass spectrometry : RCM

Issue: 14

ISSN: 0951-4198