The study of in situ scanning tunnelling microscope characterization on GaN thin film grown by plasma assisted molecular beam epitaxy (2013)

First Author: Yang R
Attributed to:  Growth and Electronic Properties of InN and N-rich Alloys funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4795790

Publication URI: http://dx.doi.org/10.1063/1.4795790

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 11