Beam Test Measurements With 3D-DDTC Silicon Strip Detectors on n-Type Substrate (2010)

First Author: Kohler M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2010.2058863

Publication URI: http://dx.doi.org/10.1109/tns.2010.2058863

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 5

ISSN: 0018-9499