Hole trapping at hydrogenic defects in amorphous silicon dioxide (2015)

First Author: El-Sayed A
Attributed to:  MATERIALS CHEMISTRY HIGH END COMPUTING CONSORTIUM funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.mee.2015.04.073

Publication URI: http://dx.doi.org/10.1016/j.mee.2015.04.073

Type: Journal Article/Review

Parent Publication: Microelectronic Engineering