3-D Finite Element Monte Carlo Simulations of Scaled Si SOI FinFET With Different Cross Sections (2015)

First Author: Nagy D

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tnano.2014.2367095

Publication URI: http://dx.doi.org/10.1109/tnano.2014.2367095

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nanotechnology

Issue: 1