NEGF for 3D Device Simulation of Nanometric Inhomogenities

First Author: Martinez A

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/9781118621523.ch10

Publication URI: http://dx.doi.org/10.1002/9781118621523.ch10

Type: Book Chapter

Book Title: Nanoscale CMOS - Innovative Materials, Modeling and Characterization (2013)

Page Reference: 335-380

ISBN: 9781848211803