Practical estimation of measurement noise and flatness deviation on focus variation microscopes (2014)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Ultra Precision
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.cirp.2014.03.086
Publication URI: http://dx.doi.org/10.1016/j.cirp.2014.03.086
Type: Journal Article/Review
Parent Publication: CIRP Annals
Issue: 1