Applications of super-resolution imaging in the field of surface topography measurement (2013)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Ultra Precision
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/2051-672x/2/2/023001
Publication URI: http://dx.doi.org/10.1088/2051-672x/2/2/023001
Type: Journal Article/Review
Parent Publication: Surface Topography: Metrology and Properties
Issue: 2