Dual-Sweep Frequency Scanning Interferometry Using Four Wave Mixing (2015)

First Author: Martinez J
Attributed to:  EPSRC Centre for Innovative Manufacturing in Ultra Precision funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/lpt.2015.2390779

Publication URI: http://dx.doi.org/10.1109/lpt.2015.2390779

Type: Journal Article/Review

Parent Publication: IEEE Photonics Technology Letters

Issue: 7