Intelligent sampling for the measurement of structured surfaces (2012)

First Author: Wang J
Attributed to:  EPSRC Centre for Innovative Manufacturing in Ultra Precision funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0957-0233/23/8/085006

Publication URI: http://dx.doi.org/10.1088/0957-0233/23/8/085006

Type: Journal Article/Review

Parent Publication: Measurement Science and Technology

Issue: 8