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Analysis of electron multiplying charge coupled device and scientific CMOS readout noise models for Shack-Hartmann wavefront sensor accuracy (2015)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/1.jatis.1.3.039002

Publication URI: http://dx.doi.org/10.1117/1.jatis.1.3.039002

Type: Journal Article/Review

Parent Publication: Journal of Astronomical Telescopes, Instruments, and Systems

Issue: 3