Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness (2011)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.3410

Publication URI: http://dx.doi.org/10.1002/sia.3410

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 1-2