Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness (2011)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.3410
Publication URI: http://dx.doi.org/10.1002/sia.3410
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: 1-2