The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology (2016)

First Author: Halak B
Attributed to:  Resilient and Testable Energy-Efficient Digital Hardware funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.microrel.2016.10.018

Publication URI: http://dx.doi.org/10.1016/j.microrel.2016.10.018

Type: Journal Article/Review

Parent Publication: Microelectronics Reliability