Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic. (2016)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0957-4484/27/15/155203

PubMed Identifier: 26938688

Publication URI: http://europepmc.org/abstract/MED/26938688

Type: Journal Article/Review

Volume: 27

Parent Publication: Nanotechnology

Issue: 15

ISSN: 0957-4484