X-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices. (2016)
Attributed to:
Reliably unreliable nanotechnologies
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/0957-4484/27/34/345705
PubMed Identifier: 27420908
Publication URI: http://europepmc.org/abstract/MED/27420908
Type: Journal Article/Review
Volume: 27
Parent Publication: Nanotechnology
Issue: 34
ISSN: 0957-4484