Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. (2016)

First Author: Yankovich AB
Attributed to:  Next Generation Multi-Dimensional X-Ray Imaging funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0957-4484/27/36/364001

PubMed Identifier: 27479946

Publication URI: http://europepmc.org/abstract/MED/27479946

Type: Journal Article/Review

Volume: 27

Parent Publication: Nanotechnology

Issue: 36

ISSN: 0957-4484