An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution (2016)

First Author: Xing J

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tcsi.2016.2538039

Publication URI: http://dx.doi.org/10.1109/tcsi.2016.2538039

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Circuits and Systems I: Regular Papers

Issue: 6