Aging Benefits in Nanometer CMOS Designs (2017)
Attributed to:
Resilient and Testable Energy-Efficient Digital Hardware
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tcsii.2016.2561206
Publication URI: http://dx.doi.org/10.1109/tcsii.2016.2561206
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Circuits and Systems II: Express Briefs
Issue: 3