Aging Benefits in Nanometer CMOS Designs (2017)

First Author: Rossi D
Attributed to:  Resilient and Testable Energy-Efficient Digital Hardware funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tcsii.2016.2561206

Publication URI: http://dx.doi.org/10.1109/tcsii.2016.2561206

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Circuits and Systems II: Express Briefs

Issue: 3