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Reliable Power Gating With NBTI Aging Benefits (2016)

First Author: Rossi D

Attributed to: Resilient and Testable Energy-Efficient Digital Hardware funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tvlsi.2016.2519385

Publication URI: http://dx.doi.org/10.1109/tvlsi.2016.2519385

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Issue: 8