Comparative studies of thin film growth on aluminium by AFM, TEM and GDOES characterization (2016)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2016.03.115

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2016.03.115

Type: Journal Article/Review

Parent Publication: Applied Surface Science