📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Absolute metrology by phase and frequency modulation for multiwavelength interferometry (2011)

First Author: Falaggis K

Attributed to: Optimum Multi-Wavelength Interferometric Sensing: Absolute Metrology from Nanometres to 100m funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1364/ol.36.002928

PubMed Identifier: 21808361

Publication URI: http://europepmc.org/abstract/MED/21808361

Type: Journal Article/Review

Parent Publication: Optics Letters

Issue: 15

ISSN: 0146-9592