Spatially resolved TiOx phases in switched RRAM devices using soft X-ray spectromicroscopy. (2016)

First Author: Carta D

Attributed to: Reliably unreliable nanotechnologies funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1038/srep21525

PubMed Identifier: 26891776

Publication URI: http://europepmc.org/abstract/MED/26891776

Type: Journal Article/Review

Volume: 6

Parent Publication: Scientific reports

ISSN: 2045-2322