A Model Assisted Testing Scheme for Modular Multilevel Converter (2016)

First Author: Tang Y
Attributed to:  Underpinning Power Electronics 2012: Components Theme funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2015.2411694

Publication URI: http://dx.doi.org/10.1109/tpel.2015.2411694

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Power Electronics

Issue: 1

ISSN: 0885-8993