Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon (2016)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/pssr.201600080
Publication URI: http://dx.doi.org/10.1002/pssr.201600080
Type: Journal Article/Review
Parent Publication: physica status solidi (RRL) - Rapid Research Letters
Issue: 6