Spectroscopic ellipsometry characterization of ZnO:Sn thin films with various Sn composition deposited by remote-plasma reactive sputtering (2017)

First Author: Janicek P
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.apsusc.2016.10.169

Publication URI: http://dx.doi.org/10.1016/j.apsusc.2016.10.169

Type: Journal Article/Review

Parent Publication: Applied Surface Science