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Nondestructive Method for Mapping Metal Contact Diffusion in In2O3 Thin-Film Transistors. (2016)

First Author: Kryvchenkova O

Attributed to: EPSRC Centre for Innovative Manufacturing in Large Area Electronics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acsami.6b10332

PubMed Identifier: 27581104

Publication URI: http://europepmc.org/abstract/MED/27581104

Type: Journal Article/Review

Volume: 8

Parent Publication: ACS applied materials & interfaces

Issue: 38

ISSN: 1944-8244