Nondestructive Method for Mapping Metal Contact Diffusion in In2O3 Thin-Film Transistors. (2016)
Attributed to:
EPSRC Centre for Innovative Manufacturing in Large Area Electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acsami.6b10332
PubMed Identifier: 27581104
Publication URI: http://europepmc.org/abstract/MED/27581104
Type: Journal Article/Review
Volume: 8
Parent Publication: ACS applied materials & interfaces
Issue: 38
ISSN: 1944-8244