Characterisation of strip silicon detectors for the ATLAS Phase-II Upgrade with a micro-focused X-ray beam (2016)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/11/07/P07023

Publication URI: http://dx.doi.org/10.1088/1748-0221/11/07/P07023

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 07