Impact of buffer charge on the reliability of carbon doped AlGaN/GaN-on-Si HEMTs (2016)
Attributed to:
Silicon Compatible GaN Power Electronics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irps.2016.7574529
Publication URI: http://dx.doi.org/10.1109/irps.2016.7574529
Type: Conference/Paper/Proceeding/Abstract
ISSN: 15417026