Coplanar to microstrip transitions for on-wafer measurements (2006)

First Author: Wang Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/mop.22056

Publication URI: http://dx.doi.org/10.1002/mop.22056

Type: Journal Article/Review

Parent Publication: Microwave and Optical Technology Letters

Issue: 1