Damage Evolution in Al Wire Bonds Subjected to a Junction Temperature Fluctuation of 30 K (2016)
Attributed to:
HubNet: Research Leadership and Networking for Energy Networks
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/s11664-016-4519-0
Publication URI: http://dx.doi.org/10.1007/s11664-016-4519-0
Type: Journal Article/Review
Parent Publication: Journal of Electronic Materials
Issue: 7