Imaging of Crystalline and Amorphous Surface Regions Using Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): Application to Pharmaceutical Materials. (2016)

First Author: Iuras A

Attributed to: Next Generation Biomaterials Discovery funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1021/acs.analchem.5b02621

PubMed Identifier: 26916467

Publication URI: http://europepmc.org/abstract/MED/26916467

Type: Journal Article/Review

Volume: 88

Parent Publication: Analytical chemistry

Issue: 7

ISSN: 0003-2700