Imaging of Crystalline and Amorphous Surface Regions Using Time-of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS): Application to Pharmaceutical Materials. (2016)

First Author: Iuras A
Attributed to:  Next Generation Biomaterials Discovery funded by EPSRC


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Bibliographic Information

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PubMed Identifier: 26916467

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Type: Journal Article/Review

Volume: 88

Parent Publication: Analytical chemistry

Issue: 7

ISSN: 0003-2700