📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Film thickness measurement and contamination layer correction for quantitative XPS (2016)

First Author: Walton J

Attributed to: Next Generation Biomaterials Discovery funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.5934

Publication URI: http://dx.doi.org/10.1002/sia.5934

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: 3

ISSN: 10969918