Scaling/LER study of Si GAA nanowire FET using 3D finite element Monte Carlo simulations (2017)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.sse.2016.10.018
Publication URI: http://dx.doi.org/10.1016/j.sse.2016.10.018
Type: Journal Article/Review
Parent Publication: Solid-State Electronics
ISSN: 00381101