📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype (2016)

First Author: Benoit M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/11/07/p07019

Publication URI: http://dx.doi.org/10.1088/1748-0221/11/07/p07019

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 07

ISSN: 1748-0221