Results of the 2015 testbeam of a 180 nm AMS High-Voltage CMOS sensor prototype (2016)

First Author: Benoit M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/11/07/P07019

Publication URI: http://dx.doi.org/10.1088/1748-0221/11/07/P07019

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 07