Quadrature wavelength scanning interferometry. (2016)
Attributed to:
Metrology for precision and additive manufacturing
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1364/ao.55.005332
PubMed Identifier: 27409307
Publication URI: http://europepmc.org/abstract/MED/27409307
Type: Journal Article/Review
Volume: 55
Parent Publication: Applied optics
Issue: 20
ISSN: 1559-128X