Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications (2016)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/11/10/p10008
Publication URI: http://dx.doi.org/10.1088/1748-0221/11/10/p10008
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 10
ISSN: 1748-0221