RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism (2016)

First Author: Chai Z
Attributed to:  Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Publication URI: http://ieeexplore.ieee.org/document/7573402/

Type: Conference/Paper/Proceeding/Abstract

Volume: 36