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A test-proven As-grown-Generation (A-G) model for predicting NBTI under use-bias (2015)

First Author: Ji Z

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/vlsit.2015.7223693

Publication URI: http://dx.doi.org/10.1109/vlsit.2015.7223693

Type: Conference/Paper/Proceeding/Abstract