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A new technique for probing the energy distribution of positive charges in gate dielectric (2014)

First Author: Ji, Z.

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Parent Publication: 2014 Ieee International Conference on Microelectronic Test Structures (Icmts)