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Understanding charge traps for optimizing Si-passivated Ge nMOSFETs (2016)

First Author: Ren P

Attributed to: Time-Dependent Variability: A test-proven modelling approach for systems verification and power consumption minimization funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/vlsit.2016.7573367

Publication URI: http://dx.doi.org/10.1109/vlsit.2016.7573367

Type: Conference/Paper/Proceeding/Abstract