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Rigorous comparison of the spectral SNR of FTIR and EC-QCL spectroscopy (Conference Presentation) (2016)

First Author: Childs D

Attributed to: In-situ monitoring of component integrity during additive manufacturing using optical coherence tomography funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2209063

Publication URI: http://dx.doi.org/10.1117/12.2209063

Type: Conference/Paper/Proceeding/Abstract