Rigorous comparison of the spectral SNR of FTIR and EC-QCL spectroscopy (Conference Presentation) (2016)
Attributed to:
In-situ monitoring of component integrity during additive manufacturing using optical coherence tomography
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.2209063
Publication URI: http://dx.doi.org/10.1117/12.2209063
Type: Conference/Paper/Proceeding/Abstract