Avalanche Ruggedness of Parallel Connected Diodes: SiC Schottky Diodes vs Silicon PiN Diodes (2016)

First Author: Ji Hu
Attributed to:  Underpinning Power Electronics 2012: Components Theme funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1049/cp.2016.0359

Publication URI: http://dx.doi.org/10.1049/cp.2016.0359

Type: Conference/Paper/Proceeding/Abstract

ISBN: 978-1-78561-188-9