An Experimental Investigation of the Tradeoff between Switching Losses and EMI Generation With Hard-Switched All-Si, Si-SiC, and All-SiC Device Combinations (2014)
Attributed to:
Underpinning Power Electronics 2012: Components Theme
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/tpel.2013.2278919
Publication URI: http://dx.doi.org/10.1109/tpel.2013.2278919
Type: Journal Article/Review
Parent Publication: IEEE Transactions on Power Electronics
Issue: 5