Characterization of InGaN/GaN epitaxial layers by aberration corrected TEM/STEM (2012)
Attributed to:
Novel Correlated Energy-Loss and Cathodoluminescence Spectroscopy in the Transmission Electron Microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/pssc.201100500
Publication URI: http://dx.doi.org/10.1002/pssc.201100500
Type: Journal Article/Review
Parent Publication: physica status solidi c
Issue: 3-4