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Application of a novel EBSD-FIB method to the transmission of c + a dislocations through  /  interfaces Ti-6Al-4V for producing in situ tension transmission electron microscopy specimens (2011)

First Author: Ding R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/jmicro/dfr077

Publication URI: http://dx.doi.org/10.1093/jmicro/dfr077

Type: Journal Article/Review

Parent Publication: Journal of Electron Microscopy

Issue: 1