Exploring transmission Kikuchi diffraction using a Timepix detector (2017)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC.
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/12/02/c02075
Publication URI: http://dx.doi.org/10.1088/1748-0221/12/02/c02075
Type: Journal Article/Review
Parent Publication: Journal of Instrumentation
Issue: 02